View and Download HP A manual change online. Impedance/Gain-Phase. A Multimeter pdf manual download. Hp A Pdf User Manuals. View online or download Hp A Manual Change. Current Directory: /HP Agilent/HP A Impedance Gain Phase Analyzer. Click on a File to download or a Directory to open. File Type. File Size. ===> Back.

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Manuals – KO4BB

I am not going to claim to be an expert on impedance measurements, but I will try to help. The “open” and “short” compensations negate effects of your leads and test fixture. It essentially measures impedance and 4194z capacitance at different frequencies and applies a linearized offset to the measurements for your unit under test.

You can perform the compensations with only your function generator in the circuit, and that should help. I no longer have acces to a A manual, but Agilent had a number of tech notes for the A, and impedance measurements in general, on their website. Quadtech also has some good tech notes on impedance measurements.

4194A Impedance/Gain-Phase Analyzer

I have a better idea now, but I 41194a still not real clear on what you are doing. I think that the analyzer is essentially a function generator. You could use the HP only, set the bias voltage to 2. Maybe you can explain why you chose k to k. Has anyone know how to READ sweep frequencies log mode Most Active Hardware Boards: Auto-suggest helps you quickly narrow down your search results by suggesting possible matches as you type.


I had a quick question on making impedance measurements of a device using the HP A when there is a function generator connected in series with the device.

From conversations I have had with Agilent, I understand that when there is a function generator or any other signal source connected in the same circuit with the analyzer, the impedance measurements cannot be trusted.

Is it possible to get the analyzer to compensate for the presence of the other source. Your input on this would be greatly appreciated. Message 11 of Message 12 of Hey Brian Thanks a lot for the quick reply. The device I am testing is a planar gold electrode system.

Without getting into the particular details of the experiment, an AC field is applied 494a the electrodes using a function generator, to form “wires” between the electrodes bridging the gap. The external AC field used to form these wires are 2.

When the electric field is turned off, the “wires” break apart and does not contact the electrodes anymore. So the device pretty much acts as a resistive switch.

I want to measure the impedance characteristics of the device when these wire form and compare it to the properties before wire formation. The frequency sweep done by the HP analyzer does not overlap the AC frequency applied by the function generator. Thanks for helping me with this Pradip.


Message 13 of Message 14 of The “device” of interest is manial active nanostructure: The device acts as a resistor for frequencies greater than kHz and when the AC field is turned off it loses its resistive behavior. The problem is that we have to manipulate the circuit element with an external AC field via a function generator and simultaneously measure the circuit properties of the active nanostructure as a function of frequency using the impedance analyzer.


As a result, we cannot use the HP analyzer as a function generator to manipulate the device and also do a frequency sweep to measure the properties at the same time. So durign the experiment 1 I use a external function generator to supply a constant 2. I chose this frequency range because the device behaves like a resistor in this frequency range. If I actuated from mabual Hz – 1 kHz using the analyzer, it would change the properties of the device.

Message 15 of Message 16 of Can you use a DC 2. If so, you can use a superimposed DC bias and measure the impedance. I am not sure that there is a way where you can janual the interference of the sine function from the Imp analyzer and the constant 2MHz 419a your FG. Message 17 of Message 18 of Message 19 of Message 20 of